SLAM for ship hull inspection using exactly sparse extended information filters

Matthew Walter, Franz Hover, John J. Leonard. SLAM for ship hull inspection using exactly sparse extended information filters. In 2008 IEEE International Conference on Robotics and Automation, ICRA 2008, May 19-23, 2008, Pasadena, California, USA. pages 1463-1470, IEEE, 2008. [doi]

Abstract

Abstract is missing.