An Expert Test Program Generation System for Per-Pin Testers

A. Walter, Y. Kleinman, L. Edelshteyn, J. Gartner. An Expert Test Program Generation System for Per-Pin Testers. In Proceedings International Test Conference 1988, Washington, D.C., USA, September 1988. pages 665-668, IEEE Computer Society, 1988.

Authors

A. Walter

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Y. Kleinman

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L. Edelshteyn

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J. Gartner

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