A. Walter, Y. Kleinman, L. Edelshteyn, J. Gartner. An Expert Test Program Generation System for Per-Pin Testers. In Proceedings International Test Conference 1988, Washington, D.C., USA, September 1988. pages 665-668, IEEE Computer Society, 1988.
@inproceedings{WalterKEG88,
title = {An Expert Test Program Generation System for Per-Pin Testers},
author = {A. Walter and Y. Kleinman and L. Edelshteyn and J. Gartner},
year = {1988},
tags = {testing},
researchr = {https://researchr.org/publication/WalterKEG88},
cites = {0},
citedby = {0},
pages = {665-668},
booktitle = {Proceedings International Test Conference 1988, Washington, D.C., USA, September 1988},
publisher = {IEEE Computer Society},
}