Seongmoon Wang. Generation of Low Power Dissipation and High Fault Coverage Patterns for Scan-Based BIST. In Proceedings IEEE International Test Conference 2002, Baltimore, MD, USA, October 7-10, 2002. pages 834-843, IEEE Computer Society, 2002. [doi]
@inproceedings{Wang02:1,
title = {Generation of Low Power Dissipation and High Fault Coverage Patterns for Scan-Based BIST},
author = {Seongmoon Wang},
year = {2002},
url = {http://csdl.computer.org/comp/proceedings/itc/2002/7543/00/75430834abs.htm},
tags = {rule-based, coverage},
researchr = {https://researchr.org/publication/Wang02%3A1},
cites = {0},
citedby = {0},
pages = {834-843},
booktitle = {Proceedings IEEE International Test Conference 2002, Baltimore, MD, USA, October 7-10, 2002},
publisher = {IEEE Computer Society},
}