Generation of Low Power Dissipation and High Fault Coverage Patterns for Scan-Based BIST - researchr publication

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Seongmoon Wang. Generation of Low Power Dissipation and High Fault Coverage Patterns for Scan-Based BIST. In Proceedings IEEE International Test Conference 2002, Baltimore, MD, USA, October 7-10, 2002. pages 834-843, IEEE Computer Society, 2002. [doi]

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