Xian Wang, Kenfack Blanchard, Estella Silva, Abhijit Chatterjee. "Safe" built-in test and tuning of boost converters using feedback loop perturbations. In 16th Latin-American Test Symposium, LATS 2015, Puerto Vallarta, Mexico, March 25-27, 2015. pages 1-6, IEEE, 2015. [doi]
@inproceedings{WangBSC15,
title = {"Safe" built-in test and tuning of boost converters using feedback loop perturbations},
author = {Xian Wang and Kenfack Blanchard and Estella Silva and Abhijit Chatterjee},
year = {2015},
doi = {10.1109/LATW.2015.7102511},
url = {http://dx.doi.org/10.1109/LATW.2015.7102511},
researchr = {https://researchr.org/publication/WangBSC15},
cites = {0},
citedby = {0},
pages = {1-6},
booktitle = {16th Latin-American Test Symposium, LATS 2015, Puerto Vallarta, Mexico, March 25-27, 2015},
publisher = {IEEE},
isbn = {978-1-4673-6710-3},
}