Xian Wang, Kenfack Blanchard, Estella Silva, Abhijit Chatterjee. "Safe" built-in test and tuning of boost converters using feedback loop perturbations. In 16th Latin-American Test Symposium, LATS 2015, Puerto Vallarta, Mexico, March 25-27, 2015. pages 1-6, IEEE, 2015. [doi]
Abstract is missing.