Using built-in self-test and adaptive recovery for defect tolerance in molecular electronics-based nanofabrics - researchr publication authors

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Zhanglei Wang, Krishnendu Chakrabarty. Using built-in self-test and adaptive recovery for defect tolerance in molecular electronics-based nanofabrics. In Proceedings 2005 IEEE International Test Conference, ITC 2005, Austin, TX, USA, November 8-10, 2005. pages 10, IEEE, 2005. [doi]

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