Zhanglei Wang, Krishnendu Chakrabarty. Using built-in self-test and adaptive recovery for defect tolerance in molecular electronics-based nanofabrics. In Proceedings 2005 IEEE International Test Conference, ITC 2005, Austin, TX, USA, November 8-10, 2005. pages 10, IEEE, 2005. [doi]
@inproceedings{WangC05-7,
title = {Using built-in self-test and adaptive recovery for defect tolerance in molecular electronics-based nanofabrics},
author = {Zhanglei Wang and Krishnendu Chakrabarty},
year = {2005},
doi = {10.1109/TEST.2005.1584008},
url = {http://doi.ieeecomputersociety.org/10.1109/TEST.2005.1584008},
researchr = {https://researchr.org/publication/WangC05-7},
cites = {0},
citedby = {0},
pages = {10},
booktitle = {Proceedings 2005 IEEE International Test Conference, ITC 2005, Austin, TX, USA, November 8-10, 2005},
publisher = {IEEE},
isbn = {0-7803-9038-5},
}