An Efficient Test Pattern Selection Method for Improving Defect Coverage with Reduced Test Data Volume and Test Application Time - researchr publication authors

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Zhanglei Wang, Krishnendu Chakrabarty. An Efficient Test Pattern Selection Method for Improving Defect Coverage with Reduced Test Data Volume and Test Application Time. In 15th Asian Test Symposium, ATS 2006, Fukuoka, Japan, November 20-23, 2006. pages 333-338, IEEE, 2006. [doi]

This author has not been identified. Look up 'Zhanglei Wang' in GoogleThis author has not been identified. Look up 'Krishnendu Chakrabarty' in Google

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