An Efficient Test Pattern Selection Method for Improving Defect Coverage with Reduced Test Data Volume and Test Application Time - researchr publication related

researchr

You are not signed in
Sign in
Sign up

Zhanglei Wang, Krishnendu Chakrabarty. An Efficient Test Pattern Selection Method for Improving Defect Coverage with Reduced Test Data Volume and Test Application Time. In 15th Asian Test Symposium, ATS 2006, Fukuoka, Japan, November 20-23, 2006. pages 333-338, IEEE, 2006. [doi]

The following publications are possibly variants of this publication:

A Seed-Selection Method to Increase Defect Coverage for LFSR-Reseeding-Based Test CompressionZhanglei Wang, Krishnendu Chakrabarty, Michael Bienek. emnets 2007: 125-130 [doi]

runs on WebDSL