Test-Quality/Cost Optimization Using Output-Deviation-Based Reordering of Test Patterns

Zhanglei Wang, Krishnendu Chakrabarty. Test-Quality/Cost Optimization Using Output-Deviation-Based Reordering of Test Patterns. IEEE Trans. on CAD of Integrated Circuits and Systems, 27(2):352-365, 2008. [doi]

Abstract

Abstract is missing.