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Built-in self-test for interposer-based 2.5D ICs

Ran Wang, Krishnendu Chakrabarty, Sudipta Bhawmik. Built-in self-test for interposer-based 2.5D ICs. In 32nd IEEE International Conference on Computer Design, ICCD 2014, Seoul, South Korea, October 19-22, 2014. pages 181-188, IEEE, 2014. [doi]

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