Min Wang, Feiyang Cheng, Kai Chen, Jinhua Mi, Zhiwei Xu, Gen Qiu. Incipient Fault Detection with Feature Ensemble Based on One-Class Machine Learning Methods. In 62nd IEEE Conference on Decision and Control, CDC 2023, Singapore, December 13-15, 2023. pages 4867-4872, IEEE, 2023. [doi]
Abstract is missing.