Wei-Lin Wang, Tseng-Yi Chen, Yuan-Hao Chang, Hsin-Wen Wei, Wei Kuan Shih. How to Cut Out Expired Data with Nearly Zero Overhead for Solid-State Drives. In 57th ACM/IEEE Design Automation Conference, DAC 2020, San Francisco, CA, USA, July 20-24, 2020. pages 1-6, IEEE, 2020. [doi]
Abstract is missing.