Qidong Wang, Aijiao Cui, Gang Qu, Huawei Li. A New Secure Scan Design with PUF-based Key for Authentication. In 38th IEEE VLSI Test Symposium, VTS 2020, San Diego, CA, USA, April 5-8, 2020. pages 1-6, IEEE, 2020. [doi]
@inproceedings{WangCQL20,
title = {A New Secure Scan Design with PUF-based Key for Authentication},
author = {Qidong Wang and Aijiao Cui and Gang Qu and Huawei Li},
year = {2020},
doi = {10.1109/VTS48691.2020.9107566},
url = {https://doi.org/10.1109/VTS48691.2020.9107566},
researchr = {https://researchr.org/publication/WangCQL20},
cites = {0},
citedby = {0},
pages = {1-6},
booktitle = {38th IEEE VLSI Test Symposium, VTS 2020, San Diego, CA, USA, April 5-8, 2020},
publisher = {IEEE},
isbn = {978-1-7281-5359-9},
}