A New Secure Scan Design with PUF-based Key for Authentication

Qidong Wang, Aijiao Cui, Gang Qu, Huawei Li. A New Secure Scan Design with PUF-based Key for Authentication. In 38th IEEE VLSI Test Symposium, VTS 2020, San Diego, CA, USA, April 5-8, 2020. pages 1-6, IEEE, 2020. [doi]

Abstract

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