Representative Critical Reliability Paths for low-cost and accurate on-chip aging evaluation

Shuo Wang, Jifeng Chen, Mohammad Tehranipoor. Representative Critical Reliability Paths for low-cost and accurate on-chip aging evaluation. In 2012 IEEE/ACM International Conference on Computer-Aided Design, ICCAD 2012, San Jose, CA, USA, November 5-8, 2012. pages 736-741, IEEE, 2012. [doi]

Abstract

Abstract is missing.