Hong-Hao Wang, Po-Yao Chuang, Cheng-Wen Wu. A Thermal Quorum Sensing Scheme for Enhancement of Integrated-Circuit Reliability and Lifetime. In 2022 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2022, Hsinchu, Taiwan, April 18-21, 2022. pages 1-4, IEEE, 2022. [doi]
Abstract is missing.