Yu Wang 0002, Xiaoming Chen, Wenping Wang, Yu Cao, Yuan Xie, Huazhong Yang. Leakage Power and Circuit Aging Cooptimization by Gate Replacement Techniques. IEEE Trans. VLSI Syst., 19(4):615-628, 2011. [doi]
@article{WangCWCXY11,
title = {Leakage Power and Circuit Aging Cooptimization by Gate Replacement Techniques},
author = {Yu Wang 0002 and Xiaoming Chen and Wenping Wang and Yu Cao and Yuan Xie and Huazhong Yang},
year = {2011},
doi = {10.1109/TVLSI.2009.2037637},
url = {http://dx.doi.org/10.1109/TVLSI.2009.2037637},
researchr = {https://researchr.org/publication/WangCWCXY11},
cites = {0},
citedby = {0},
journal = {IEEE Trans. VLSI Syst.},
volume = {19},
number = {4},
pages = {615-628},
}