Leakage Power and Circuit Aging Cooptimization by Gate Replacement Techniques

Yu Wang 0002, Xiaoming Chen, Wenping Wang, Yu Cao, Yuan Xie, Huazhong Yang. Leakage Power and Circuit Aging Cooptimization by Gate Replacement Techniques. IEEE Trans. VLSI Syst., 19(4):615-628, 2011. [doi]

Abstract

Abstract is missing.