Semi-supervised metric learning by maximizing constraint margin - researchr publication authors

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Fei Wang, Shouchun Chen, Changshui Zhang, Tao Li. Semi-supervised metric learning by maximizing constraint margin. In James G. Shanahan, Sihem Amer-Yahia, Ioana Manolescu, Yi Zhang, David A. Evans, Aleksander Kolcz, Key-Sun Choi, Abdur Chowdhury, editors, Proceedings of the 17th ACM Conference on Information and Knowledge Management, CIKM 2008, Napa Valley, California, USA, October 26-30, 2008. pages 1457-1458, ACM, 2008. [doi]

This author has not been identified. Look up 'Fei Wang' in GoogleThis author has not been identified. Look up 'Shouchun Chen' in GoogleThis author has not been identified. Look up 'Changshui Zhang' in GoogleThis author has not been identified. Look up 'Tao Li' in Google

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