Fei Wang, Shouchun Chen, Changshui Zhang, Tao Li. Semi-supervised metric learning by maximizing constraint margin. In James G. Shanahan, Sihem Amer-Yahia, Ioana Manolescu, Yi Zhang, David A. Evans, Aleksander Kolcz, Key-Sun Choi, Abdur Chowdhury, editors, Proceedings of the 17th ACM Conference on Information and Knowledge Management, CIKM 2008, Napa Valley, California, USA, October 26-30, 2008. pages 1457-1458, ACM, 2008. [doi]
@inproceedings{WangCZL08,
title = {Semi-supervised metric learning by maximizing constraint margin},
author = {Fei Wang and Shouchun Chen and Changshui Zhang and Tao Li},
year = {2008},
doi = {10.1145/1458082.1458331},
url = {http://doi.acm.org/10.1145/1458082.1458331},
tags = {constraints},
researchr = {https://researchr.org/publication/WangCZL08},
cites = {0},
citedby = {0},
pages = {1457-1458},
booktitle = {Proceedings of the 17th ACM Conference on Information and Knowledge Management, CIKM 2008, Napa Valley, California, USA, October 26-30, 2008},
editor = {James G. Shanahan and Sihem Amer-Yahia and Ioana Manolescu and Yi Zhang and David A. Evans and Aleksander Kolcz and Key-Sun Choi and Abdur Chowdhury},
publisher = {ACM},
isbn = {978-1-59593-991-3},
}