Fei Wang, Shouchun Chen, Changshui Zhang, Tao Li. Semi-supervised metric learning by maximizing constraint margin. In James G. Shanahan, Sihem Amer-Yahia, Ioana Manolescu, Yi Zhang, David A. Evans, Aleksander Kolcz, Key-Sun Choi, Abdur Chowdhury, editors, Proceedings of the 17th ACM Conference on Information and Knowledge Management, CIKM 2008, Napa Valley, California, USA, October 26-30, 2008. pages 1457-1458, ACM, 2008. [doi]
Abstract is missing.