Ran Wang, Sergej Deutsch, Mukesh Agrawal, Krishnendu Chakrabarty. The hype, myths, and realities of testing 3D integrated circuits. In Frank Liu, editor, Proceedings of the 35th International Conference on Computer-Aided Design, ICCAD 2016, Austin, TX, USA, November 7-10, 2016. pages 58, ACM, 2016. [doi]
Abstract is missing.