Haibin Wang, Xixi Dai, Yangsheng Wang, Issam Nofal, Li Cai, Zicai Shen, Wanxiu Sun, Jinshun Bi, Bo Li 0051, Gang Guo, Li Chen, Sang H. Baeg. A single event upset tolerant latch design. Microelectronics Reliability, 88:909-913, 2018. [doi]
Abstract is missing.