A single event upset tolerant latch design

Haibin Wang, Xixi Dai, Yangsheng Wang, Issam Nofal, Li Cai, Zicai Shen, Wanxiu Sun, Jinshun Bi, Bo Li 0051, Gang Guo, Li Chen, Sang H. Baeg. A single event upset tolerant latch design. Microelectronics Reliability, 88:909-913, 2018. [doi]

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