NLP based on GCVAE for intelligent Fault Analysis in Semiconductor industry - researchr publication authors

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Zhiqiang Wang, Kenneth Ezukwoke, Anis Hoayek, Mireille Batton-Hubert, Xavier Boucher. NLP based on GCVAE for intelligent Fault Analysis in Semiconductor industry. In 27th IEEE International Conference on Emerging Technologies and Factory Automation, ETFA 2022, Stuttgart, Germany, September 6-9, 2022. pages 1-8, IEEE, 2022. [doi]

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