Zhiqiang Wang, Kenneth Ezukwoke, Anis Hoayek, Mireille Batton-Hubert, Xavier Boucher. NLP based on GCVAE for intelligent Fault Analysis in Semiconductor industry. In 27th IEEE International Conference on Emerging Technologies and Factory Automation, ETFA 2022, Stuttgart, Germany, September 6-9, 2022. pages 1-8, IEEE, 2022. [doi]
@inproceedings{WangEHBB22,
title = {NLP based on GCVAE for intelligent Fault Analysis in Semiconductor industry},
author = {Zhiqiang Wang and Kenneth Ezukwoke and Anis Hoayek and Mireille Batton-Hubert and Xavier Boucher},
year = {2022},
doi = {10.1109/ETFA52439.2022.9921524},
url = {https://doi.org/10.1109/ETFA52439.2022.9921524},
researchr = {https://researchr.org/publication/WangEHBB22},
cites = {0},
citedby = {0},
pages = {1-8},
booktitle = {27th IEEE International Conference on Emerging Technologies and Factory Automation, ETFA 2022, Stuttgart, Germany, September 6-9, 2022},
publisher = {IEEE},
isbn = {978-1-6654-9996-5},
}