Albert Z. Wang, Haigang Feng, Rouying Zhan, Guang Chen, Q. Wu. ESD protection design for RF integrated circuits: new challenges. In Proceedings of the IEEE 2002 Custom Integrated Circuits Conference, CICC 2002, Orlando, FL, USA, May 12-15, 2002. pages 411-418, IEEE, 2002. [doi]
@inproceedings{WangFZCW02,
title = {ESD protection design for RF integrated circuits: new challenges},
author = {Albert Z. Wang and Haigang Feng and Rouying Zhan and Guang Chen and Q. Wu},
year = {2002},
doi = {10.1109/CICC.2002.1012860},
url = {https://doi.org/10.1109/CICC.2002.1012860},
researchr = {https://researchr.org/publication/WangFZCW02},
cites = {0},
citedby = {0},
pages = {411-418},
booktitle = {Proceedings of the IEEE 2002 Custom Integrated Circuits Conference, CICC 2002, Orlando, FL, USA, May 12-15, 2002},
publisher = {IEEE},
isbn = {0-7803-7250-6},
}