ESD protection design for RF integrated circuits: new challenges

Albert Z. Wang, Haigang Feng, Rouying Zhan, Guang Chen, Q. Wu. ESD protection design for RF integrated circuits: new challenges. In Proceedings of the IEEE 2002 Custom Integrated Circuits Conference, CICC 2002, Orlando, FL, USA, May 12-15, 2002. pages 411-418, IEEE, 2002. [doi]

Abstract

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