LT-RTPG: a new test-per-scan BIST TPG for low switching activity

Seongmoon Wang, Sandeep K. Gupta. LT-RTPG: a new test-per-scan BIST TPG for low switching activity. IEEE Trans. on CAD of Integrated Circuits and Systems, 25(8):1565-1574, 2006. [doi]

Abstract

Abstract is missing.