Peikun Wang, Amir Masoud Gharehbaghi, Masahiro Fujita. Automatic Test Pattern Generation for Double Stuck-at Faults Based on Test Patterns of Single Faults. In 20th International Symposium on Quality Electronic Design, ISQED 2019, Santa Clara, CA, USA, March 6-7, 2019. pages 284-290, IEEE, 2019. [doi]
Abstract is missing.