Peikun Wang, Amir Masoud Gharehbaghi, Masahiro Fujita. An Incremental Automatic Test Pattern Generation Method for Multiple Stuck-at Faults. In 37th IEEE VLSI Test Symposium, VTS 2019, Monterey, CA, USA, April 23-25, 2019. pages 1-6, IEEE, 2019. [doi]
Abstract is missing.