Experimental verification of a correlation-based correction algorithm for multi-bit delta-sigma ADCs

Xuesheng Wang, Yuhua Guo, Un-Ku Moon, Gabor C. Temes. Experimental verification of a correlation-based correction algorithm for multi-bit delta-sigma ADCs. In Proceedings of the IEEE 2004 Custom Integrated Circuits Conference, CICC 2004, Orlando, FL, USA, October 2004. pages 523-526, IEEE, 2004. [doi]

Abstract

Abstract is missing.