Testing and Diagnosis of Interconnect Structures in FPGAs

Sying-Jyan Wang, Chao-Neng Huang. Testing and Diagnosis of Interconnect Structures in FPGAs. In 7th Asian Test Symposium (ATS 98), 2-4 December 1998, Singapore. pages 283, IEEE Computer Society, 1998. [doi]

Abstract

Abstract is missing.