Assembly Defect Detection of Atomizers Based on Machine Vision - researchr publication authors

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Jiankun Wang, Hong Hu, Long Chen, Caiying He. Assembly Defect Detection of Atomizers Based on Machine Vision. In Proceedings of the 2019 4th International Conference on Automation, Control and Robotics Engineering, CACRE 2019, Shenzhen, China, July 19-21, 2019. ACM, 2019. [doi]

This author has not been identified. Look up 'Jiankun Wang' in GoogleThis author has not been identified. Look up 'Hong Hu' in GoogleThis author has not been identified. Look up 'Long Chen' in GoogleThis author has not been identified. Look up 'Caiying He' in Google

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