Jiankun Wang, Hong Hu, Long Chen, Caiying He. Assembly Defect Detection of Atomizers Based on Machine Vision. In Proceedings of the 2019 4th International Conference on Automation, Control and Robotics Engineering, CACRE 2019, Shenzhen, China, July 19-21, 2019. ACM, 2019. [doi]
@inproceedings{WangHCH19,
title = {Assembly Defect Detection of Atomizers Based on Machine Vision},
author = {Jiankun Wang and Hong Hu and Long Chen and Caiying He},
year = {2019},
doi = {10.1145/3351917.3351925},
url = {https://doi.org/10.1145/3351917.3351925},
researchr = {https://researchr.org/publication/WangHCH19},
cites = {0},
citedby = {0},
booktitle = {Proceedings of the 2019 4th International Conference on Automation, Control and Robotics Engineering, CACRE 2019, Shenzhen, China, July 19-21, 2019},
publisher = {ACM},
isbn = {978-1-4503-7186-5},
}