Leakage Current Optimization Techniques During Test Based on Don t Care Bits Assignment - researchr publication authors

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Wei Wang, Yu Hu, Yinhe Han, Xiaowei Li, You-Sheng Zhang. Leakage Current Optimization Techniques During Test Based on Don t Care Bits Assignment. J. Comput. Sci. Technol., 22(5):673-680, 2007. [doi]

This author has not been identified. Look up 'Wei Wang' in GoogleThis author has not been identified. Look up 'Yu Hu' in GoogleThis author has not been identified. Look up 'Yinhe Han' in GoogleThis author has not been identified. Look up 'Xiaowei Li' in GoogleThis author has not been identified. Look up 'You-Sheng Zhang' in Google

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