Wei Wang, Yu Hu, Yinhe Han, Xiaowei Li, You-Sheng Zhang. Leakage Current Optimization Techniques During Test Based on Don t Care Bits Assignment. J. Comput. Sci. Technol., 22(5):673-680, 2007. [doi]
@article{WangHHLZ07,
title = {Leakage Current Optimization Techniques During Test Based on Don t Care Bits Assignment},
author = {Wei Wang and Yu Hu and Yinhe Han and Xiaowei Li and You-Sheng Zhang},
year = {2007},
doi = {10.1007/s11390-007-9091-x},
url = {http://dx.doi.org/10.1007/s11390-007-9091-x},
tags = {optimization, rule-based, testing},
researchr = {https://researchr.org/publication/WangHHLZ07},
cites = {0},
citedby = {0},
journal = {J. Comput. Sci. Technol.},
volume = {22},
number = {5},
pages = {673-680},
}