Leakage Current Optimization Techniques During Test Based on Don t Care Bits Assignment

Wei Wang, Yu Hu, Yinhe Han, Xiaowei Li, You-Sheng Zhang. Leakage Current Optimization Techniques During Test Based on Don t Care Bits Assignment. J. Comput. Sci. Technol., 22(5):673-680, 2007. [doi]

Abstract

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