Adaptive Diagnostic Pattern Generation for Scan Chains

Fei Wang, Yu Hu, Xiaowei Li. Adaptive Diagnostic Pattern Generation for Scan Chains. In 4th IEEE International Symposium on Electronic Design, Test and Applications, DELTA 2008, Hong Kong, January 23-25, 2008. pages 129-132, IEEE Computer Society, 2008. [doi]

Authors

Fei Wang

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Yu Hu

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Xiaowei Li

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