Fei Wang, Yu Hu, Xiaowei Li. Adaptive Diagnostic Pattern Generation for Scan Chains. In 4th IEEE International Symposium on Electronic Design, Test and Applications, DELTA 2008, Hong Kong, January 23-25, 2008. pages 129-132, IEEE Computer Society, 2008. [doi]
@inproceedings{WangHL08, title = {Adaptive Diagnostic Pattern Generation for Scan Chains}, author = {Fei Wang and Yu Hu and Xiaowei Li}, year = {2008}, doi = {10.1109/DELTA.2008.45}, url = {http://doi.ieeecomputersociety.org/10.1109/DELTA.2008.45}, tags = {diagnostics}, researchr = {https://researchr.org/publication/WangHL08}, cites = {0}, citedby = {0}, pages = {129-132}, booktitle = {4th IEEE International Symposium on Electronic Design, Test and Applications, DELTA 2008, Hong Kong, January 23-25, 2008}, publisher = {IEEE Computer Society}, }