Sying-Jyan Wang, Han-Hsuan Hsu, Katherine Shu-Min Li. Low-power delay test architecture for pre-bond test. In 2012 IEEE International Symposium on Circuits and Systems, ISCAS 2012, Seoul, Korea (South), May 20-23, 2012. pages 2321-2324, IEEE, 2012. [doi]
Abstract is missing.