Fei Wang, Yu Hu, Huawei Li, Xiaowei Li 0001, Jing Ye, Yu Huang. Deterministic Diagnostic Pattern Generation (DDPG) for Compound Defects. In Douglas Young, Nur A. Touba, editors, 2008 IEEE International Test Conference, ITC 2008, Santa Clara, California, USA, October 26-31, 2008. pages 1-10, IEEE, 2008. [doi]
Abstract is missing.