EBL: Efficient background learning for x-ray security inspection - researchr publication authors

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Wei Wang, Linyang He, Yiqing Li, Kai Zhou, Linchao Li, Guohua Cheng, Ting Wen. EBL: Efficient background learning for x-ray security inspection. Appl. Intell., 53(9):11357-11372, May 2023. [doi]

This author has not been identified. Look up 'Wei Wang' in GoogleThis author has not been identified. Look up 'Linyang He' in GoogleThis author has not been identified. Look up 'Yiqing Li' in GoogleThis author has not been identified. Look up 'Kai Zhou' in GoogleThis author has not been identified. Look up 'Linchao Li' in GoogleThis author has not been identified. Look up 'Guohua Cheng' in GoogleThis author has not been identified. Look up 'Ting Wen' in Google

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