EBL: Efficient background learning for x-ray security inspection

Wei Wang, Linyang He, Yiqing Li, Kai Zhou, Linchao Li, Guohua Cheng, Ting Wen. EBL: Efficient background learning for x-ray security inspection. Appl. Intell., 53(9):11357-11372, May 2023. [doi]

Abstract

Abstract is missing.