Wei Wang, Linyang He, Yiqing Li, Kai Zhou, Linchao Li, Guohua Cheng, Ting Wen. EBL: Efficient background learning for x-ray security inspection. Appl. Intell., 53(9):11357-11372, May 2023. [doi]
@article{WangHLZLCW23, title = {EBL: Efficient background learning for x-ray security inspection}, author = {Wei Wang and Linyang He and Yiqing Li and Kai Zhou and Linchao Li and Guohua Cheng and Ting Wen}, year = {2023}, month = {May}, doi = {10.1007/s10489-022-04075-1}, url = {https://doi.org/10.1007/s10489-022-04075-1}, researchr = {https://researchr.org/publication/WangHLZLCW23}, cites = {0}, citedby = {0}, journal = {Appl. Intell.}, volume = {53}, number = {9}, pages = {11357-11372}, }