STREAM: Stress and Thermal Aware Reliability Management for 3-D ICs

Hai Wang 0002, Darong Huang, Rui Liu, Chi Zhang, He Tang, Yuan Yuan. STREAM: Stress and Thermal Aware Reliability Management for 3-D ICs. IEEE Trans. on CAD of Integrated Circuits and Systems, 38(11):2058-2071, 2019. [doi]

Abstract

Abstract is missing.