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Retention-Aware DRAM Assembly and Repair for Future FGR Memories

Ying Wang, Yinhe Han, Cheng Wang, Huawei Li, Xiaowei Li 0001. Retention-Aware DRAM Assembly and Repair for Future FGR Memories. IEEE Trans. on CAD of Integrated Circuits and Systems, 36(5):705-718, 2017. [doi]

Authors

Ying Wang

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Yinhe Han

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Cheng Wang

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Huawei Li

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Xiaowei Li 0001

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